ESGE Days 2021
    Going virtual. Staying real.,
    
        25.-27.03.2021
    
    
    
    
    
    
        
            Chairman: Mario Dinis- Ribeiro (Portugal) ESGE President and ESGE Days 2021 Scientific Committee Chairman
        
    
    
                
                
                
                
                  
                  
                
                  
                    
                  
                  
                
                  
                    
                  
                  
                
                    
                
              
              
              
              
              
              
                
  
  
    
      
        OP73
      
    
  
  
  
    
    
    
      
    
    
      
        
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
          
          
            
              
              Nieuwenhuis, EA; 
              
            
          
            
              
              van Munster, SN; 
              
            
          
            
              
              Weusten, BLAM; 
              
            
          
            
              
              Alvarez Herrero, L; 
              
            
          
            
              
              Bogte, A; 
              
            
          
            
              
              Alkhalaf, A; 
              
            
          
            
              
              Schenk, BE; 
              
            
          
            
              
              Schoon, E; 
              
            
          
            
              
              Curvers, WL; 
              
            
          
            
              
              Koch, AD; 
              
            
          
            
              
              Spaander, MCW; 
              
            
          
            
              
              Tang, T; 
              
            
          
            
              
              Nagengast, WB; 
              
            
          
            
              
              Westerhof, J; 
              
            
          
            
              
              Houben, MHMG; 
              
            
          
            
              
              Bergman, JJGHM; 
              
            
          
            
              
              Pouw, RE; 
              
            
          
            
              
              
                
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                
                
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                
                  Dutch Barrett Expert Centers: 
                
              
            
          
      
    
    
    
    
      
      
        
      
      
        
        
        
      
    
    
      
    
    
    
    
    
    
    
      
    
   
              
                
  
  
    
      
        OP74
      
    
  
  
  
    
    
    
      
    
    
      
        
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
          
          
            
              
              van Munster, SN; 
              
            
          
            
              
              Nieuwenhuis, EA; 
              
            
          
            
              
              Weusten, BLAM; 
              
            
          
            
              
              Alvarez Herrero, L; 
              
            
          
            
              
              Bogte, A; 
              
            
          
            
              
              Alkhalaf, A; 
              
            
          
            
              
              Schenk, BE; 
              
            
          
            
              
              Schoon, E; 
              
            
          
            
              
              Curvers, WL; 
              
            
          
            
              
              Koch, AD; 
              
            
          
            
              
              de Jonge, PJ; 
              
            
          
            
              
              Tang, T; 
              
            
          
            
              
              Nagengast, WB; 
              
            
          
            
              
              Westerhof, J; 
              
            
          
            
              
              Houben, MHMG; 
              
            
          
            
              
              Bergman, JJGHM; 
              
            
          
            
              
              Pouw, RE; 
              
            
          
            
              
              
                
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                
                
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                  
                
                
                  Dutch Barrett Expert Centers: 
                
              
            
          
      
    
    
    
    
      
      
        
      
      
        
        
        
      
    
    
      
    
    
    
    
    
    
    
      
    
   
              
                
  
  
    
      
        OP75
      
    
  
  
  
    
    
    
      
    
    
      
        
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
          
          
            
              
              van Munster, SN; 
              
            
          
            
              
              Frederiks, CN; 
              
            
          
            
              
              Alvarez Herrero, L; 
              
            
          
            
              
              Bogte, A; 
              
            
          
            
              
              Alkhalaf, A; 
              
            
          
            
              
              Schenk, BE; 
              
            
          
            
              
              Schoon, E; 
              
            
          
            
              
              Curvers, W; 
              
            
          
            
              
              Koch, AD; 
              
            
          
            
              
              van de Ven, SEM; 
              
            
          
            
              
              de Jonge, PJF; 
              
            
          
            
              
              Tang, T; 
              
            
          
            
              
              Nagengast, WB; 
              
            
          
            
              
              Peters, FTM; 
              
            
          
            
              
              Westerhof, J; 
              
            
          
            
              
              Houben, MHMG; 
              
            
          
            
              
              Bergman, JJ; 
              
            
          
            
              
              Pouw, RE; 
              
            
          
            
              
              Weusten, BLAM: 
              
            
          
      
    
    
    
    
      
      
        
      
      
        
        
        
      
    
    
      
    
    
    
    
    
    
    
      
    
   
              
                
  
  
    
      
        OP76
      
    
  
  
  
    
    
    
      
    
    
      
        
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
          
          
            
              
              Schmidt, I; 
              
            
          
            
              
              Zhao, X; 
              
            
          
            
              
              Kats-Ugurlu, G; 
              
            
          
            
              
              van der Waaij, A.M; 
              
            
          
            
              
              Gabriels, RY; 
              
            
          
            
              
              van der Laan, JJ; 
              
            
          
            
              
              Dijkstra, FA; 
              
            
          
            
              
              Haveman, JW; 
              
            
          
            
              
              van Etten, B; 
              
            
          
            
              
              Robinson, DJ; 
              
            
          
            
              
              Nagengast, WB: 
              
            
          
      
    
    
    
    
      
      
        
      
      
        
        
        
      
    
    
      
    
    
    
    
    
    
    
      
    
   
              
                
  
  
    
      
        OP77
      
    
  
  
  
    
    
    
      
    
    
      
        
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
            
              
            
          
          
          
            
              
              Marques de Sá, I; 
              
            
          
            
              
              Leal, C; 
              
            
          
            
              
              Silva, J; 
              
            
          
            
              
              Falcão, D; 
              
            
          
            
              
              Felix, C; 
              
            
          
            
              
              Nascimento, C; 
              
            
          
            
              
              Boal Carvalho, P; 
              
            
          
            
              
              Vasconcelos, H; 
              
            
          
            
              
              Pedroto, I; 
              
            
          
            
              
              Chagas, C; 
              
            
          
            
              
              Cravo, M; 
              
            
          
            
              
              Cotter, J; 
              
            
          
            
              
              Sharma, P; 
              
            
          
            
              
              Dinis-Ribeiro, M: