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X-ray crystal structure analysis of 1d: formula C21H25NO2, M = 323.42, colourless crystal 0.40 × 0.40 × 0.20 mm, a = 12.118(2), b = 13.509(2), c = 23.090(4) Å, β = 92.32(1)°, V = 3776.8(11) Å3, ρcalc = 1.138 g cm-3, µ = 0.72 cm-1, no absorption correction (0.994 ≤ C ≤ 0.999), Z = 8, monoclinic, space group P21/c (No. 14), λ = 0.71073 Å, T = 293 K, ω/2θ scans, 6700 reflections collected (+h,+k, ±l), [(sinθ)/λ] = 0.59 Å-1, 6374 independent (R
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[36]
<A NAME="RT10601SS-18">18</A>
If not denoted otherwise in Tables: the first letter corresponds to the substrate
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X-ray crystal structure analysis of 9a: formula C25H35NO2, M = 381.54, colourless crystal 0.70 × 0.50 × 0.30 mm, a = 29.416(5), c = 11.006(2) Å, V = 9524(3) Å3, ρcalc = 1.064 g cm-3, µ = 0.66 cm-1, empirical absorption correction via ψ scan data (0.928 ≤ C ≤ 0.999), Z = 16, tetragonal, space group I41/a (No. 88), λ = 0.71073 Å, T = 293 K, ω/2θ scans, 8176 reflections collected (+h, ±k,+l), [(sinθ)/λ] = 0.59 Å-1, 4011 independent (R
int = 0.099) and 1859 observed reflections [I ≥ 2 σ(I)], 258 refined parameters, R = 0.062, wR
2 = 0.161, max. residual electron density 0.18 (-0.17) e Å-3, hydrogens calculated and refined as riding atoms.
[36]
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X-ray crystal structure analysis of 17: formula C23H35NO4, M = 389.52, colourless crystal 0.30 × 0.25 × 0.15 mm, a = 10.689(1), b = 10.717(1), c = 10.953(1) Å, α = 101.53(1), β = 96.47(1), γ = 108.18(1)°, V = 1147.2(2) Å3, ρcalc = 1.128 g cm-3, µ = 0.76 cm-1, no absorption correction (0.978 ≤ T ≤ 0.989), Z = 2, triclinic, space group P1bar (No. 2), λ = 0.71073 Å, T = 293 K, ω and φ scans, 8217 reflections collected (±h, ±k, ±l), [(sinθ)/λ] = 0.65 Å-1, 5220 independent (R
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<A NAME="RT10601SS-36A">36a</A> X-ray analysis
<A NAME="RT10601SS-36B">36b</A> X-ray data sets were collected with Enraf-Nonius CAD4 and Nonius Kappa CCD diffractometers,
the later one equipped with a rotating anode generator Nonius FR591. Programs used:
data collection EXPRESS (Nonius B.V., 1994) and COLLECT (Nonius B.V., 1998), data
reduction MolEN (K. Fair, Enraf-Nonius B.V., 1990) and Denzo-SMN:
Otwinowski Z.
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<A NAME="RT10601SS-36C">36c</A> Absorption correction for CCD data SORTAV:
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Acta Crystallogr.
1995,
A51:
33
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Blessing RH.
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<A NAME="RT10601SS-36E">36e</A> Structure solution SHELXS-86 and SHELXS-97:
Sheldrick GM.
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1990,
A46:
467
<A NAME="RT10601SS-36F">36f</A>
Sheldrick GM.
Structure refinement SHELXL-93 and SHELXL-97
Universität Göttingen;
Germany:
1997.
<A NAME="RT10601SS-36G">36g</A> Graphics:
Keller E.
SCHAKAL
Universität Freiburg;
Germany:
1997.
<A NAME="RT10601SS-36H">36h</A>
Crystallographic data (excluding structure factors) for the structure reported in
this paper have been deposited with Cambridge Crystallographic Data Centre as supplementary publication No. CCDC-156957-156959. Copies of the data can be obtained
free of charge on application to The Director, CCDC, 12 Union Road, Cambridge CB2
1EZ, UK (fax: int. code+44(1223)336-033; e-mail: deposit@ccdc.cam.ac.uk).